Multilayer reflectometry and quantitative analysis of higher order diffraction impurities of grating monochromator

Tadashi Hatano, Tetsuo Harada

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    Spectral impurity of the beam delivered by a soft X-ray synchrotron beamline is often a problem because higher order components of a grating monochromator cause some error in quantitative measurements. To achieve a correct data analysis, characterization of the higher order diffraction impurities is needed. This paper describes a simple and easy method, where a reflective multilayer is used to pick one out of a series of diffraction orders with the angle of incidence adjusted. The reflectance of the multilayer is first measured at harmonic energies 2E, 3E and 4E at an angle of incidence φn satisfying the Bragg condition in the first order, where E is the fundamental energy. Then, setting sequentially the angle of incidence of the multilayer at φn, reflectance is measured around E, where the measured value is reflectance for the energy nE multiplied by the proportion of the nth order component. Thus, impurity spectrum is obtained. The present method can be generally used for any beamline and any energy. Experiments were performed at BL-11D of the Photon Factory, KEK, at 282 eV using a Cr/C multilayer, and the proportion of the first order was found to be 0.915. The normal incidence reflectance of the multilayer was measured, and the intrinsic value for pure 282 eV light was estimated to be 20.4% by purity factor correction.

    Original languageEnglish
    Pages (from-to)156-158
    Number of pages3
    JournalJournal of Electron Spectroscopy and Related Phenomena
    Volume196
    DOIs
    Publication statusPublished - 2014 Oct

    Keywords

    • Higher order diffraction
    • Multilayer
    • Reflectometry
    • Soft X-ray

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Radiation
    • Atomic and Molecular Physics, and Optics
    • Condensed Matter Physics
    • Spectroscopy
    • Physical and Theoretical Chemistry

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