MTJ-based nonvolatile logic LSI for ultra low-power and highly dependable computing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A novel logic-LSI architecture, 'nonvolatile logic-in-memory (NV-LIM) architecture,' where nonvolatile storage elements are distributed over a logic-circuit plane, is proposed as a promising candidate to overcome performance, power and reliability wall on the present CMOS-only-based logic LSIs. Some concrete design examples based on the NV-LIM architecture using MTJ device are demonstrated and their usefulness is discussed in comparison with the corresponding CMOS-only-based realization.

Original languageEnglish
Title of host publicationChina Semiconductor Technology International Conference 2018, CSTIC 2018
EditorsHanming Wu, Peilin Song, Qinghuang Lin, Yuchun Wang, Cor Claeys, Hsiang-Lang Lung, Ying Zhang, Steve Liang, Yiyu Shi, Ru Huang, Zhen Guo, Kafai Lai
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781538653081
DOIs
Publication statusPublished - 2018 May 29
Event2018 China Semiconductor Technology International Conference, CSTIC 2018 - Shanghai, China
Duration: 2018 Mar 112018 Mar 12

Publication series

NameChina Semiconductor Technology International Conference 2018, CSTIC 2018

Other

Other2018 China Semiconductor Technology International Conference, CSTIC 2018
CountryChina
CityShanghai
Period18/3/1118/3/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Natsui, M., Endoh, T., Ohno, H., & Hanyu, T. (2018). MTJ-based nonvolatile logic LSI for ultra low-power and highly dependable computing. In H. Wu, P. Song, Q. Lin, Y. Wang, C. Claeys, H-L. Lung, Y. Zhang, S. Liang, Y. Shi, R. Huang, Z. Guo, & K. Lai (Eds.), China Semiconductor Technology International Conference 2018, CSTIC 2018 (pp. 1-4). (China Semiconductor Technology International Conference 2018, CSTIC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CSTIC.2018.8369189