Magnetic force microscope (MFM) was used to characterize the L1 0 ordered FePt(001) films sputter deposited on MgO(001) substrates. It was found that the morphology varied from isolated particles to continuous films when the nominal thickness (tN) was changed. The coercivity showed a marked change at the percolation boundary of tN ≅ 45 nm.
ASJC Scopus subject areas
- Physics and Astronomy(all)