Morphology and domain pattern of L10 ordered FePt films

G. Q. Li, H. Takahoshi, H. Ito, H. Saito, S. Ishio, T. Shima, K. Takanashi

Research output: Contribution to journalArticlepeer-review

57 Citations (Scopus)


Magnetic force microscope (MFM) was used to characterize the L1 0 ordered FePt(001) films sputter deposited on MgO(001) substrates. It was found that the morphology varied from isolated particles to continuous films when the nominal thickness (tN) was changed. The coercivity showed a marked change at the percolation boundary of tN ≅ 45 nm.

Original languageEnglish
Pages (from-to)5672-5677
Number of pages6
JournalJournal of Applied Physics
Issue number9
Publication statusPublished - 2003 Nov 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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