Monochromatization of characteristic X-rays using stepped X-ray waveguide

Kouichi Hayashi; Katsunori Sakai; Hisataka Takenaka

doi:10.1016/j.tsf.2006.12.017

Monochromatization of characteristic X-rays using stepped X-ray waveguide

Kouichi Hayashi, Katsunori Sakai, Hisataka Takenaka

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Depending on the X-ray energy, the structure of an X-ray waveguide needs to be varied for greater efficiency. Therefore, a Si/PMMA(polymethyl methacrylate)/Si thin-film structure, whose top Si layer was steplike, was designed as a planar X-ray waveguide on the basis of calculations, and it was fabricated by spin-coating and sputtering. By irradiating white X-rays on two selected areas of a stepped waveguide, the top-layer thicknesses of which were different, W Lβ and Mo Kα lines were effectively guided and monochromatized.

Original language	English
Pages (from-to)	5728-5731
Number of pages	4
Journal	Thin Solid Films
Volume	515
Issue number	14 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.tsf.2006.12.017
Publication status	Published - 2007 May 23
Externally published	Yes

Keywords

Organic thin film
X-ray reflectivity
X-ray waveguide

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2006.12.017

Cite this

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title = "Monochromatization of characteristic X-rays using stepped X-ray waveguide",

abstract = "Depending on the X-ray energy, the structure of an X-ray waveguide needs to be varied for greater efficiency. Therefore, a Si/PMMA(polymethyl methacrylate)/Si thin-film structure, whose top Si layer was steplike, was designed as a planar X-ray waveguide on the basis of calculations, and it was fabricated by spin-coating and sputtering. By irradiating white X-rays on two selected areas of a stepped waveguide, the top-layer thicknesses of which were different, W Lβ and Mo Kα lines were effectively guided and monochromatized.",

keywords = "Organic thin film, X-ray reflectivity, X-ray waveguide",

author = "Kouichi Hayashi and Katsunori Sakai and Hisataka Takenaka",

note = "Funding Information: This work was partly supported by a Grant-in-Aid for Scientific Research (18656003) from the Ministry of Education, Culture, Sports, Science and Technology, Japan.",

year = "2007",

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doi = "10.1016/j.tsf.2006.12.017",

language = "English",

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number = "14 SPEC. ISS.",

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TY - JOUR

T1 - Monochromatization of characteristic X-rays using stepped X-ray waveguide

AU - Hayashi, Kouichi

AU - Sakai, Katsunori

AU - Takenaka, Hisataka

N1 - Funding Information: This work was partly supported by a Grant-in-Aid for Scientific Research (18656003) from the Ministry of Education, Culture, Sports, Science and Technology, Japan.

PY - 2007/5/23

Y1 - 2007/5/23

N2 - Depending on the X-ray energy, the structure of an X-ray waveguide needs to be varied for greater efficiency. Therefore, a Si/PMMA(polymethyl methacrylate)/Si thin-film structure, whose top Si layer was steplike, was designed as a planar X-ray waveguide on the basis of calculations, and it was fabricated by spin-coating and sputtering. By irradiating white X-rays on two selected areas of a stepped waveguide, the top-layer thicknesses of which were different, W Lβ and Mo Kα lines were effectively guided and monochromatized.

AB - Depending on the X-ray energy, the structure of an X-ray waveguide needs to be varied for greater efficiency. Therefore, a Si/PMMA(polymethyl methacrylate)/Si thin-film structure, whose top Si layer was steplike, was designed as a planar X-ray waveguide on the basis of calculations, and it was fabricated by spin-coating and sputtering. By irradiating white X-rays on two selected areas of a stepped waveguide, the top-layer thicknesses of which were different, W Lβ and Mo Kα lines were effectively guided and monochromatized.

KW - Organic thin film

KW - X-ray reflectivity

KW - X-ray waveguide

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DO - 10.1016/j.tsf.2006.12.017

M3 - Article

AN - SCOPUS:34247150663

SN - 0040-6090

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JO - Thin Solid Films

JF - Thin Solid Films

IS - 14 SPEC. ISS.

ER -

Monochromatization of characteristic X-rays using stepped X-ray waveguide

Abstract

Keywords

ASJC Scopus subject areas

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