Molten metal flux growth and properties of CrSi2

T. Shishido, S. Okada, Y. Ishizawa, K. Kudou, K. Iizumi, Y. Sawada, H. Horiuchi, K. Inaba, T. Sekiguchi, J. Ye, S. Miyashita, A. Nomura, T. Sugawara, K. Obara, M. Oku, K. Fujiwara, T. Ujihara, G. Sazaki, N. Usami, S. KohikiY. Kawazoe, K. Nakajima

Research output: Contribution to journalConference articlepeer-review

10 Citations (Scopus)


Single crystals of CrSi2 were obtained in the form of hexagonal prisms by the solution growth method using molten tin as a flux. The maximum size of the crystal is about 0.3mm in diameter and 25mm in length. The crystal structure of CrSi2 has hexagonal symmetry with space group P6 222 and the lattice parameters are a=0.425(2)nm and c=0.6375(1)nm, respectively. The crystals are semiconducting. The value of the micro-Vickers hardness for the {11̄00} face with hexagonal symmetry is 11.2±0.4GPa. Weight gain of the crystals heated up to 1473K in air is negligible.

Original languageEnglish
Pages (from-to)319-321
Number of pages3
JournalJournal of Alloys and Compounds
Issue number1-2
Publication statusPublished - 2004 Nov 30
Externally publishedYes
EventProceedings of the 14th International Conference on Solid Comp. - Linz, Austria
Duration: 2003 Jul 62003 Jul 11


  • Chromium disilicide
  • Crystal growth
  • Electrical resistivity
  • Flux method
  • Micro-Vickers hardness
  • Oxidation resistivity

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry


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