Abstract
We have studied atomic structures of α-sexithienyl (6T) films grown on Cu(110) by reflection high energy electron diffraction (RHEED), and near edge X-ray absorption fine structure (NEXAFS). A one-dimensional (1D) ordered structure of 6T could be fabricated by deposition at 300 K and subsequent annealing at 360 K. The 6T molecules adsorbed with their molecular long axes parallel to the Cu[001] direction. The mechanism of the 1D structure formation is discussed by the lattice model and the charge density waves.
| Original language | English |
|---|---|
| Pages (from-to) | 603-607 |
| Number of pages | 5 |
| Journal | Surface Science |
| Volume | 566-568 |
| Issue number | 1-3 PART 1 |
| DOIs | |
| Publication status | Published - 2004 Sep 20 |
| Externally published | Yes |
| Event | Proceedings of the 22nd European Conference on Surface Science - Prague, Czech Republic Duration: 2003 Sep 7 → 2003 Sep 12 |
Keywords
- Epitaxy
- Near edge extended X-ray absorption fine structure (NEXAFS)
- Reflection high-energy electron diffraction (RHEED)
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry
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Cite this
Kiguchi, M., Yoshikawa, G., Ikeda, S., & Saiki, K. (2004). Molecular orientation control of sexithienyl thin film on Cu substrates. Surface Science, 566-568(1-3 PART 1), 603-607. https://doi.org/10.1016/j.susc.2004.05.131