Molecular dynamics simulation of form measurement process of soft materials using atomic force microscope

Yindi Cai; Yuan Liu Chen; Yuki Shimizu; So Ito; Wei Gao

doi:10.1109/NEMS.2016.7758221

Molecular dynamics simulation of form measurement process of soft materials using atomic force microscope

Yindi Cai, Yuan Liu Chen, Yuki Shimizu, So Ito, Wei Gao

ENG - Finemechanics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Molecular dynamics simulations of contact mode form measurement process on a soft substrate with a special surface profile using a diamond AFM tip are preformed to investigate the contact behavior and the surface profile damages or distortions of the measured substrate. The process of contact mode imaging of the AFM can be treated as the process of nano-scratching. The simulation-predicted interaction force, including scratching force and normal force, characterizes the saw-tooth pattern, which is referred to as atomic stick-slips. The shape of measured substrate surface, especially the surface underneath the AFM tip, is distorted by the interaction force between the AFM tip and the substrate surface.

Original language	English
Title of host publication	2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	156-159
Number of pages	4
ISBN (Electronic)	9781509019472
DOIs	https://doi.org/10.1109/NEMS.2016.7758221
Publication status	Published - 2016 Nov 28
Event	11th IEEE Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016 - Sendai, Japan Duration: 2016 Apr 17 → 2016 Apr 20

Publication series

Name	2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016

Other

Other	11th IEEE Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016
Country	Japan
City	Sendai
Period	16/4/17 → 16/4/20

Keywords

AFM
friction force
molecular dynamics simulations
soft material
surface damages

ASJC Scopus subject areas

Industrial and Manufacturing Engineering
Mechanical Engineering
Mechanics of Materials
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/NEMS.2016.7758221

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Cite this

Cai, Y., Chen, Y. L., Shimizu, Y., Ito, S., & Gao, W. (2016). Molecular dynamics simulation of form measurement process of soft materials using atomic force microscope. In 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016 (pp. 156-159). [7758221] (2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NEMS.2016.7758221

Molecular dynamics simulation of form measurement process of soft materials using atomic force microscope. / Cai, Yindi; Chen, Yuan Liu; Shimizu, Yuki; Ito, So; Gao, Wei.

2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 156-159 7758221 (2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cai, Y, Chen, YL, Shimizu, Y, Ito, S & Gao, W 2016, Molecular dynamics simulation of form measurement process of soft materials using atomic force microscope. in 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016., 7758221, 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016, Institute of Electrical and Electronics Engineers Inc., pp. 156-159, 11th IEEE Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016, Sendai, Japan, 16/4/17. https://doi.org/10.1109/NEMS.2016.7758221

Cai Y, Chen YL, Shimizu Y, Ito S, Gao W. Molecular dynamics simulation of form measurement process of soft materials using atomic force microscope. In 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 156-159. 7758221. (2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016). https://doi.org/10.1109/NEMS.2016.7758221

Cai, Yindi ; Chen, Yuan Liu ; Shimizu, Yuki ; Ito, So ; Gao, Wei. / Molecular dynamics simulation of form measurement process of soft materials using atomic force microscope. 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 156-159 (2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016).

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AB - Molecular dynamics simulations of contact mode form measurement process on a soft substrate with a special surface profile using a diamond AFM tip are preformed to investigate the contact behavior and the surface profile damages or distortions of the measured substrate. The process of contact mode imaging of the AFM can be treated as the process of nano-scratching. The simulation-predicted interaction force, including scratching force and normal force, characterizes the saw-tooth pattern, which is referred to as atomic stick-slips. The shape of measured substrate surface, especially the surface underneath the AFM tip, is distorted by the interaction force between the AFM tip and the substrate surface.

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