Modeling connector contact condition using a contact failure model with equivalent inductance

Yu-Ichi Hayashi, Songping Wu, Jun Fan, Takaaki Mizuki, Hideaki Sone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

It is found from previous studies on the immunity issues of CATV coaxial cables due to contact failure that, when contact resistance is small, the contact distribution and the number of contact points become factors that affect the degradation in immunity of the cables. However, when contact resistance is relatively large, the effects of the contact distribution and the number of contact points are negligible. In this paper, the physics of this phenomenon is further studied. Simulation results, validated by measurement, reveal that the contact distribution and the number of contact points contribute to parasitic inductances that could change the current distribution among the contact points, and further affect the immunity performance of the cables. Using a contact failure model proposed in this paper, cable contact scenarios at the connectors with different contact distributions and numbers of contact points can be simply simulated by changing the inductance term in the model.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Pages743-747
Number of pages5
DOIs
Publication statusPublished - 2010 Dec 1
Event2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Fort Lauderdale, FL, United States
Duration: 2010 Jul 252010 Jul 30

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Other

Other2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010
CountryUnited States
CityFort Lauderdale, FL
Period10/7/2510/7/30

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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