TY - GEN
T1 - Modeling connector contact condition using a contact failure model with equivalent inductance
AU - Hayashi, Yu-Ichi
AU - Wu, Songping
AU - Fan, Jun
AU - Mizuki, Takaaki
AU - Sone, Hideaki
PY - 2010/12/1
Y1 - 2010/12/1
N2 - It is found from previous studies on the immunity issues of CATV coaxial cables due to contact failure that, when contact resistance is small, the contact distribution and the number of contact points become factors that affect the degradation in immunity of the cables. However, when contact resistance is relatively large, the effects of the contact distribution and the number of contact points are negligible. In this paper, the physics of this phenomenon is further studied. Simulation results, validated by measurement, reveal that the contact distribution and the number of contact points contribute to parasitic inductances that could change the current distribution among the contact points, and further affect the immunity performance of the cables. Using a contact failure model proposed in this paper, cable contact scenarios at the connectors with different contact distributions and numbers of contact points can be simply simulated by changing the inductance term in the model.
AB - It is found from previous studies on the immunity issues of CATV coaxial cables due to contact failure that, when contact resistance is small, the contact distribution and the number of contact points become factors that affect the degradation in immunity of the cables. However, when contact resistance is relatively large, the effects of the contact distribution and the number of contact points are negligible. In this paper, the physics of this phenomenon is further studied. Simulation results, validated by measurement, reveal that the contact distribution and the number of contact points contribute to parasitic inductances that could change the current distribution among the contact points, and further affect the immunity performance of the cables. Using a contact failure model proposed in this paper, cable contact scenarios at the connectors with different contact distributions and numbers of contact points can be simply simulated by changing the inductance term in the model.
UR - http://www.scopus.com/inward/record.url?scp=79952424138&partnerID=8YFLogxK
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U2 - 10.1109/ISEMC.2010.5711371
DO - 10.1109/ISEMC.2010.5711371
M3 - Conference contribution
AN - SCOPUS:79952424138
SN - 9781424463053
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 743
EP - 747
BT - IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
T2 - 2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010
Y2 - 25 July 2010 through 30 July 2010
ER -