Modeling and implementation of subthreshold characteristics of accumulation-mode MOSFETs for various SOI layer thickness and impurity concentrations

Rihito Kuroda, Akinobu Teramoto, W. Cheng, Shigetoshi Sugawa, T. Ohmi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Fingerprint Dive into the research topics of 'Modeling and implementation of subthreshold characteristics of accumulation-mode MOSFETs for various SOI layer thickness and impurity concentrations'. Together they form a unique fingerprint.