Modeling and implementation of subthreshold characteristics of accumulation-mode MOSFETs for various SOI layer thickness and impurity concentrations

Rihito Kuroda, Akinobu Teramoto, W. Cheng, Shigetoshi Sugawa, T. Ohmi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
Original languageEnglish
Title of host publication2007 IEEE International SOI Conference Proceedings
Pages55-56
Number of pages2
DOIs
Publication statusPublished - 2007 Dec 1
Event2007 IEEE International Systems-on-Chip Conference, SOI - Indian Wells, CA, United States
Duration: 2007 Oct 12007 Oct 4

Publication series

NameProceedings - IEEE International SOI Conference
ISSN (Print)1078-621X

Other

Other2007 IEEE International Systems-on-Chip Conference, SOI
CountryUnited States
CityIndian Wells, CA
Period07/10/107/10/4

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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