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Mobile-ion-induced charge loss failure in silicon-oxide-nitride-oxide- silicon two-bit storage flash memory
Kazunori Imaoka, Masahiko Higashi, Hidehiko Shiraiwa, Fumihiko Inoue, Tatsuya Kajita, Shigetoshi Sugawa
Research output: Contribution to journal › Article › peer-review
3
Citations
(Scopus)