Fingerprint
Dive into the research topics of 'Mobile-ion-induced charge loss failure in silicon-oxide-nitride-oxide- silicon two-bit storage flash memory'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Kazunori Imaoka, Masahiko Higashi, Hidehiko Shiraiwa, Fumihiko Inoue, Tatsuya Kajita, Shigetoshi Sugawa
Research output: Contribution to journal › Article › peer-review