Mobile-ion-induced charge loss failure in silicon-oxide-nitride-oxide- silicon two-bit storage flash memory

Kazunori Imaoka, Masahiko Higashi, Hidehiko Shiraiwa, Fumihiko Inoue, Tatsuya Kajita, Shigetoshi Sugawa

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Engineering & Materials Science

Physics & Astronomy