Millisecond-order X-ray phase tomography with a fringe-scanning method

Wataru Yashiro, Chika Kamezawa, Daiji Noda, Kentaro Kajiwara

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)


We successfully realized millisecond-order X-ray phase tomography using a fringe-scanning method in grating-based X-ray interferometry. We obtained phase tomograms with a measurement time of 4.43 ms using a white synchrotron X-ray beam. The use of a fringe-scanning method enables us to achieve not only a higher spatial resolution but also a higher signal-to-noise ratio than that attained by the Fourier transform method. In addition, our approach can be applied to realize four-dimensional or high-throughput X-ray tomography for samples that can be rotated at a high speed.

Original languageEnglish
Article number122501
JournalApplied Physics Express
Issue number12
Publication statusPublished - 2018 Dec

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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