TY - JOUR
T1 - Millisecond-order X-ray phase tomography with a fringe-scanning method
AU - Yashiro, Wataru
AU - Kamezawa, Chika
AU - Noda, Daiji
AU - Kajiwara, Kentaro
N1 - Funding Information:
Acknowledgments The experiment was performed in SPring-8 (proposal numbers: 2015A1525, 2015B1263, 2016A1258, and 2016B1229). This research was supported by JSPS KAKENHI Grant Numbers JP15H03590, JP26600137, and JST CREST Grant Number JPMJCR1765.
Publisher Copyright:
© 2018 The Japan Society of Applied Physics.
PY - 2018/12
Y1 - 2018/12
N2 - We successfully realized millisecond-order X-ray phase tomography using a fringe-scanning method in grating-based X-ray interferometry. We obtained phase tomograms with a measurement time of 4.43 ms using a white synchrotron X-ray beam. The use of a fringe-scanning method enables us to achieve not only a higher spatial resolution but also a higher signal-to-noise ratio than that attained by the Fourier transform method. In addition, our approach can be applied to realize four-dimensional or high-throughput X-ray tomography for samples that can be rotated at a high speed.
AB - We successfully realized millisecond-order X-ray phase tomography using a fringe-scanning method in grating-based X-ray interferometry. We obtained phase tomograms with a measurement time of 4.43 ms using a white synchrotron X-ray beam. The use of a fringe-scanning method enables us to achieve not only a higher spatial resolution but also a higher signal-to-noise ratio than that attained by the Fourier transform method. In addition, our approach can be applied to realize four-dimensional or high-throughput X-ray tomography for samples that can be rotated at a high speed.
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U2 - 10.7567/APEX.11.122501
DO - 10.7567/APEX.11.122501
M3 - Article
AN - SCOPUS:85056699556
VL - 11
JO - Applied Physics Express
JF - Applied Physics Express
SN - 1882-0778
IS - 12
M1 - 122501
ER -