The aim of all X-ray topographic methods is to provide a picture of the distribution of the defects in a crystal. By using Si(220) monochrometor irradiated by an incident beam of 3mm X0.1mm, the effect of annealing on texture of 3He at about 0.3mK and of 4He at about 0.5mk by the fixed point observation were taken on every three hours by emulsion plate, together with the diffraction patterns by scanning the incident beam over some extent near the vicinity of the fixed point. Annealing effect could not be observed in 4He but it was very conspicuous in 3He.
ASJC Scopus subject areas
- Physics and Astronomy(all)