Microstructure of bit patterned media and recording characteristics in perpendicular magnetic recording

H. Muraoka, Y. Nakamura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The recording physics of bit patterned media is studied for areal densities of around 2 Tbits/inch2, focused on number of grains per bit. Write error rate and signal to noise ratio in a function of number of grains are derived as analytical functions based on the statistics theory on the binomial distribution. Modeling of writing process based on the head field gradient and switching field distribution and interference fields, is presented to extract the write-head and media parameters which are necessary to attain a high areal density recording.

Original languageEnglish
Title of host publicationECS Transactions - Magnetic Materials, Processes and Devices 10 - 214th ECS Meeting
Pages47-56
Number of pages10
Edition45
DOIs
Publication statusPublished - 2009 Nov 23
EventMagnetic Materials, Processes and Devices 10 - 214th ECS Meeting - Honolulu, HI, United States
Duration: 2008 Oct 122008 Oct 17

Publication series

NameECS Transactions
Number45
Volume16
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Other

OtherMagnetic Materials, Processes and Devices 10 - 214th ECS Meeting
CountryUnited States
CityHonolulu, HI
Period08/10/1208/10/17

ASJC Scopus subject areas

  • Engineering(all)

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