Microstructure and magnetic property of electroless-plated CoNiFeB soft underlayer

W. X. Xia, J. J. Kim, T. Yogo, D. Shindo, M. Ito, K. Ohashi

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)

    Abstract

    An electroless-plated CoFeNiB film as a soft underlayer in perpendicular magnetic recording is studied by magneto-optical Kerr effect microscope, magnetic force microscopy (MFM), and transmission electron microscopy. A stray field is evidently suppressed for the anisotropic CoFeNiB film, which is under an applied field during the plating process. The lines of magnetic flux show that the Ni seed layer have no intrinsic effect on the homogenous magnetic state of the CoFeNiB layer. The interaction between a MFM tip and the CoFeNiB layer is clearly observed by electron holography indicating the excellent soft magnetic properties required by the soft underlayer.

    Original languageEnglish
    Pages (from-to)3011-3014
    Number of pages4
    JournalJournal of Magnetism and Magnetic Materials
    Volume320
    Issue number22
    DOIs
    Publication statusPublished - 2008 Nov 1

    Keywords

    • Electron holography
    • Perpendicular magnetic recording
    • Soft underlayer
    • Transmission electron microscopy

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

    Fingerprint

    Dive into the research topics of 'Microstructure and magnetic property of electroless-plated CoNiFeB soft underlayer'. Together they form a unique fingerprint.

    Cite this