Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media

Tadaaki Oikawa, Miyabi Nakamura, Hiroyuki Uwazumi, Takehito Shimatsu, Hiroaki Muraoka, Yoshihisa Nakamura

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Abstract

Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media were investigated. Magnetron sputtering was used to deposit CoPtCr-SiO2 recording layer on 20 nm-thick Ru seed layer. Fine grains of 6 nm and amorphous-like grain boundaries consisting of SiOx were observed. Coercivity of more than 4 KOe and loop squareness of more than 0.9 were obtained at the thickness of the recording layer of more than 15 nm.

Original languageEnglish
JournalDigests of the Intermag Conference
Publication statusPublished - 2002 Dec 1
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Microstructure and magnetic properties of CoPtCr-SiO<sub>2</sub> perpendicular recording media'. Together they form a unique fingerprint.

Cite this