TY - JOUR
T1 - Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media
AU - Oikawa, Tadaaki
AU - Nakamura, M.
AU - Uwazumi, H.
AU - Shimatsu, T.
AU - Muraoka, H.
AU - Nakamura, Y.
N1 - Funding Information:
Manuscript received February 14, 2002; revised May 24, 2002. This work was supported in part by the Research for the Future Program of JSPS (JSPS-RFTF 99R14401) and SRC. T. Oikawa and M. Nakamura are with Fuji Electric Corporate Research and Development Ltd., Matsumoto 390-0821, Japan (e-mail: oikawa-tadaaki@fuji-electric.co.jp). H. Uwazumi is with Fuji Electric Company, Ltd., Matsumoto 390-0821, Japan. T. Shimatsu, H. Muraoka, and Y. Nakamura are with the Research Institute of Electrical Communication, Tohoku University, Sendai 980-8577, Japan (e-mail: shimatsu@riec.tohoku.ac.jp). Digital Object Identifier 10.1109/TMAG.2002.801791.
PY - 2002/9
Y1 - 2002/9
N2 - SiO2 added CoPtCr magnetic layer is employed for the perpendicular recording media. The microstructure, magnetic properties, and recording performance of these media are discussed. Very fine grains of the size of ∼7 nm, surrounded by amorphous-like grain boundaries, are realized together with good c-axis orientation normal to the film plane. It is considered that the addition of SiO2 to CoPtCr is very effective to realize well-isolated fine-grain structure without disturbing the epitaxial growth of CoPtCr grains on Ru underlayer. The medium with 12-nm-thick recording layer shows a large perpendicular anisotropy Ku of ∼4 × 106 erg/cm3, and high coercivity Hc of ∼4 kOe. Moreover, the medium shows excellent SNR performance together with high thermal stability, indicating a great potential for high-density perpendicular recording media.
AB - SiO2 added CoPtCr magnetic layer is employed for the perpendicular recording media. The microstructure, magnetic properties, and recording performance of these media are discussed. Very fine grains of the size of ∼7 nm, surrounded by amorphous-like grain boundaries, are realized together with good c-axis orientation normal to the film plane. It is considered that the addition of SiO2 to CoPtCr is very effective to realize well-isolated fine-grain structure without disturbing the epitaxial growth of CoPtCr grains on Ru underlayer. The medium with 12-nm-thick recording layer shows a large perpendicular anisotropy Ku of ∼4 × 106 erg/cm3, and high coercivity Hc of ∼4 kOe. Moreover, the medium shows excellent SNR performance together with high thermal stability, indicating a great potential for high-density perpendicular recording media.
KW - CoPtCr
KW - Film Microstructure
KW - Media noise performance
KW - Perpendicular recording media
KW - SiO
KW - Thermal stability
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U2 - 10.1109/TMAG.2002.801791
DO - 10.1109/TMAG.2002.801791
M3 - Conference article
AN - SCOPUS:0036762030
VL - 38
SP - 1976
EP - 1978
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
SN - 0018-9464
IS - 5 I
T2 - 2002 International Magnetics Conference (Intermag 2002)
Y2 - 28 April 2002 through 2 May 2002
ER -