Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media

Tadaaki Oikawa, M. Nakamura, H. Uwazumi, T. Shimatsu, H. Muraoka, Y. Nakamura

Research output: Contribution to journalConference articlepeer-review

188 Citations (Scopus)

Abstract

SiO2 added CoPtCr magnetic layer is employed for the perpendicular recording media. The microstructure, magnetic properties, and recording performance of these media are discussed. Very fine grains of the size of ∼7 nm, surrounded by amorphous-like grain boundaries, are realized together with good c-axis orientation normal to the film plane. It is considered that the addition of SiO2 to CoPtCr is very effective to realize well-isolated fine-grain structure without disturbing the epitaxial growth of CoPtCr grains on Ru underlayer. The medium with 12-nm-thick recording layer shows a large perpendicular anisotropy Ku of ∼4 × 106 erg/cm3, and high coercivity Hc of ∼4 kOe. Moreover, the medium shows excellent SNR performance together with high thermal stability, indicating a great potential for high-density perpendicular recording media.

Original languageEnglish
Pages (from-to)1976-1978
Number of pages3
JournalIEEE Transactions on Magnetics
Volume38
Issue number5 I
DOIs
Publication statusPublished - 2002 Sep 1
Event2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Keywords

  • CoPtCr
  • Film Microstructure
  • Media noise performance
  • Perpendicular recording media
  • SiO
  • Thermal stability

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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