Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media

Tadaaki Oikawa; M. Nakamura; H. Uwazumi; T. Shimatsu; H. Muraoka; Y. Nakamura

doi:10.1109/TMAG.2002.801791

Microstructure and magnetic properties of CoPtCr-SiO₂ perpendicular recording media

Tadaaki Oikawa, M. Nakamura, H. Uwazumi, T. Shimatsu, H. Muraoka, Y. Nakamura

Research output: Contribution to journal › Conference article

187 Citations (Scopus)

Abstract

SiO₂ added CoPtCr magnetic layer is employed for the perpendicular recording media. The microstructure, magnetic properties, and recording performance of these media are discussed. Very fine grains of the size of ∼7 nm, surrounded by amorphous-like grain boundaries, are realized together with good c-axis orientation normal to the film plane. It is considered that the addition of SiO₂ to CoPtCr is very effective to realize well-isolated fine-grain structure without disturbing the epitaxial growth of CoPtCr grains on Ru underlayer. The medium with 12-nm-thick recording layer shows a large perpendicular anisotropy K_u of ∼4 × 10⁶ erg/cm³, and high coercivity H_c of ∼4 kOe. Moreover, the medium shows excellent SNR performance together with high thermal stability, indicating a great potential for high-density perpendicular recording media.

Original language	English
Pages (from-to)	1976-1978
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	38
Issue number	5 I
DOIs	https://doi.org/10.1109/TMAG.2002.801791
Publication status	Published - 2002 Sep 1
Event	2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2

Keywords

CoPtCr
Film Microstructure
Media noise performance
Perpendicular recording media
SiO
Thermal stability

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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Oikawa, T., Nakamura, M., Uwazumi, H., Shimatsu, T., Muraoka, H., & Nakamura, Y. (2002). Microstructure and magnetic properties of CoPtCr-SiO₂ perpendicular recording media. IEEE Transactions on Magnetics, 38(5 I), 1976-1978. https://doi.org/10.1109/TMAG.2002.801791

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title = "Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media",

abstract = "SiO2 added CoPtCr magnetic layer is employed for the perpendicular recording media. The microstructure, magnetic properties, and recording performance of these media are discussed. Very fine grains of the size of ∼7 nm, surrounded by amorphous-like grain boundaries, are realized together with good c-axis orientation normal to the film plane. It is considered that the addition of SiO2 to CoPtCr is very effective to realize well-isolated fine-grain structure without disturbing the epitaxial growth of CoPtCr grains on Ru underlayer. The medium with 12-nm-thick recording layer shows a large perpendicular anisotropy Ku of ∼4 × 106 erg/cm3, and high coercivity Hc of ∼4 kOe. Moreover, the medium shows excellent SNR performance together with high thermal stability, indicating a great potential for high-density perpendicular recording media.",

keywords = "CoPtCr, Film Microstructure, Media noise performance, Perpendicular recording media, SiO, Thermal stability",

author = "Tadaaki Oikawa and M. Nakamura and H. Uwazumi and T. Shimatsu and H. Muraoka and Y. Nakamura",

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T1 - Microstructure and magnetic properties of CoPtCr-SiO2 perpendicular recording media

AU - Oikawa, Tadaaki

AU - Nakamura, M.

AU - Uwazumi, H.

AU - Shimatsu, T.

AU - Muraoka, H.

AU - Nakamura, Y.

PY - 2002/9/1

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N2 - SiO2 added CoPtCr magnetic layer is employed for the perpendicular recording media. The microstructure, magnetic properties, and recording performance of these media are discussed. Very fine grains of the size of ∼7 nm, surrounded by amorphous-like grain boundaries, are realized together with good c-axis orientation normal to the film plane. It is considered that the addition of SiO2 to CoPtCr is very effective to realize well-isolated fine-grain structure without disturbing the epitaxial growth of CoPtCr grains on Ru underlayer. The medium with 12-nm-thick recording layer shows a large perpendicular anisotropy Ku of ∼4 × 106 erg/cm3, and high coercivity Hc of ∼4 kOe. Moreover, the medium shows excellent SNR performance together with high thermal stability, indicating a great potential for high-density perpendicular recording media.

AB - SiO2 added CoPtCr magnetic layer is employed for the perpendicular recording media. The microstructure, magnetic properties, and recording performance of these media are discussed. Very fine grains of the size of ∼7 nm, surrounded by amorphous-like grain boundaries, are realized together with good c-axis orientation normal to the film plane. It is considered that the addition of SiO2 to CoPtCr is very effective to realize well-isolated fine-grain structure without disturbing the epitaxial growth of CoPtCr grains on Ru underlayer. The medium with 12-nm-thick recording layer shows a large perpendicular anisotropy Ku of ∼4 × 106 erg/cm3, and high coercivity Hc of ∼4 kOe. Moreover, the medium shows excellent SNR performance together with high thermal stability, indicating a great potential for high-density perpendicular recording media.

KW - CoPtCr

KW - Film Microstructure

KW - Media noise performance

KW - Perpendicular recording media

KW - SiO

KW - Thermal stability

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