Abstract
Lanthanum strontium manganate (La0.7Sr0.3MnO3: LSMO) thin films were grown on SiO2/Si substrates by a metallo-organic decomposition method, and their crystalline structure, microstructure and electrical properties were investigated. X-ray diffraction analysis indicated that La0.7Sr0.3MnO3 films with a perovskite single phase could be obtained by annealing at 700 °C. Transmission electron microscopy (TEM) images showed that the films consisted of packed grains with a mean grain size of approximately 25 nm. The resistivity of the La0.7Sr0.3MnO3 films decreased rapidly as the annealing temperature increased from 550 to 700 °C, and did not change greatly with increasing annealing temperature from 700 °C. The La0.7Sr0.3MnO3 films annealed at 700 °C had a lower resistivity of 5.70×10-4 Ω m.
Original language | English |
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Pages (from-to) | 68-73 |
Number of pages | 6 |
Journal | Journal of Crystal Growth |
Volume | 293 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2006 Jul 15 |
Keywords
- A1. Crystal structure
- A1. Microstructure
- A1. X-ray diffraction
- B1. Oxides
- B1. Perovskites
- B2. Electric materials
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry