Microstructural characterization of superplastic SiO2-doped TZP with a small amount of oxide addition

Parjaree Thavorniti, Yuichi Ikuhara, Taketo Sakuma

    Research output: Contribution to journalArticlepeer-review

    46 Citations (Scopus)

    Abstract

    The microstructures of 5 wt% SiO2-doped TZP, 5 wt% (SiO2 + 2 wt% MgO)-doped TZP, and 5 wt% (SiO2 + 2 wt% Al2O3)-doped TZP are characterized by high-resolution electron microscopy, energy-dispersive X-ray spectroscopy, and electron energy loss spectroscopy. An amorphous phase is formed at multiple grain junctions but not along the grain-boundary faces in these three materials. A small addition of MgO and Al2O3 into the SiO2 phase results in a marked reduction in tensile ductility of SiO2-doped TZP. This reduction seems to correlate with segregation of magnesium or aluminum ions at grain boundaries and a resultant change in the chemical bonding state.

    Original languageEnglish
    Pages (from-to)2927-2932
    Number of pages6
    JournalJournal of the American Ceramic Society
    Volume81
    Issue number11
    DOIs
    Publication statusPublished - 1998 Nov

    ASJC Scopus subject areas

    • Ceramics and Composites
    • Materials Chemistry

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