TY - JOUR
T1 - Microstructural characterization of superplastic SiO2-doped TZP with a small amount of oxide addition
AU - Thavorniti, Parjaree
AU - Ikuhara, Yuichi
AU - Sakuma, Taketo
PY - 1998/11
Y1 - 1998/11
N2 - The microstructures of 5 wt% SiO2-doped TZP, 5 wt% (SiO2 + 2 wt% MgO)-doped TZP, and 5 wt% (SiO2 + 2 wt% Al2O3)-doped TZP are characterized by high-resolution electron microscopy, energy-dispersive X-ray spectroscopy, and electron energy loss spectroscopy. An amorphous phase is formed at multiple grain junctions but not along the grain-boundary faces in these three materials. A small addition of MgO and Al2O3 into the SiO2 phase results in a marked reduction in tensile ductility of SiO2-doped TZP. This reduction seems to correlate with segregation of magnesium or aluminum ions at grain boundaries and a resultant change in the chemical bonding state.
AB - The microstructures of 5 wt% SiO2-doped TZP, 5 wt% (SiO2 + 2 wt% MgO)-doped TZP, and 5 wt% (SiO2 + 2 wt% Al2O3)-doped TZP are characterized by high-resolution electron microscopy, energy-dispersive X-ray spectroscopy, and electron energy loss spectroscopy. An amorphous phase is formed at multiple grain junctions but not along the grain-boundary faces in these three materials. A small addition of MgO and Al2O3 into the SiO2 phase results in a marked reduction in tensile ductility of SiO2-doped TZP. This reduction seems to correlate with segregation of magnesium or aluminum ions at grain boundaries and a resultant change in the chemical bonding state.
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U2 - 10.1111/j.1151-2916.1998.tb02715.x
DO - 10.1111/j.1151-2916.1998.tb02715.x
M3 - Article
AN - SCOPUS:0032208089
VL - 81
SP - 2927
EP - 2932
JO - Journal of the American Ceramic Society
JF - Journal of the American Ceramic Society
SN - 0002-7820
IS - 11
ER -