Microstructural analysis of secondary phases in silicon carbide fabricated with SiC nano-powder and sintering additives

Takaaki Koyanagi; Sosuke Kondo; Tatsuya Hinoki

Microstructural analysis of secondary phases in silicon carbide fabricated with SiC nano-powder and sintering additives

Takaaki Koyanagi, Sosuke Kondo, Tatsuya Hinoki

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Chemical composition, structure and distribution of secondary phases in two kinds of monolithic SiC ceramics fabricated by liquid phase sintering with SiC nano-powder and 6 or 9 wt.% sintering additives of Al₂O₃ and Y₂O₃ were investigated. The major secondary phase in both samples was identified as crystalline yttrium aluminum garnet (YAG) by XRD pattern. EPMA-WDS analysis revealed that the sample containing 9 wt.% additives had the relatively distinct Y-rich and Al-rich regions, by contrast with relatively-homogeneous distribution of the additives elements in the sample containing 6 wt.% additives. The dominating secondary phases at triple junctions of YAG for Y-rich regions and Al₂O₃ for Al-rich regions in SiC (9 wt.% additives) were identified by TEM-EELS analysis. In SiC (6 wt.% additives), the dominating YAG was observed at triple junctions. High-resolution TEM revealed that amorphous films with content Y, Al and O existed at both the SiC-SiC and SiC-YAG grain boundaries.

Original language	English
Title of host publication	Ceramic Materials for Energy Applications - A Collection of Papers Presented at the 35th International Conference on Advanced Ceramics and Composites, ICACC
Pages	53-61
Number of pages	9
Volume	32
Edition	9
Publication status	Published - 2011 Nov 7
Externally published	Yes
Event	Ceramic Materials for Energy Applications - 35th International Conference on Advanced Ceramics and Composites, ICACC - Daytona Beach, FL, United States Duration: 2011 Jan 23 → 2011 Jan 28

Other

Other	Ceramic Materials for Energy Applications - 35th International Conference on Advanced Ceramics and Composites, ICACC
Country	United States
City	Daytona Beach, FL
Period	11/1/23 → 11/1/28

ASJC Scopus subject areas

Ceramics and Composites
Materials Chemistry

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Microstructural analysis of secondary phases in silicon carbide fabricated with SiC nano-powder and sintering additives. / Koyanagi, Takaaki; Kondo, Sosuke; Hinoki, Tatsuya.

Ceramic Materials for Energy Applications - A Collection of Papers Presented at the 35th International Conference on Advanced Ceramics and Composites, ICACC. Vol. 32 9. ed. 2011. p. 53-61.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Koyanagi, T, Kondo, S & Hinoki, T 2011, Microstructural analysis of secondary phases in silicon carbide fabricated with SiC nano-powder and sintering additives. in Ceramic Materials for Energy Applications - A Collection of Papers Presented at the 35th International Conference on Advanced Ceramics and Composites, ICACC. 9 edn, vol. 32, pp. 53-61, Ceramic Materials for Energy Applications - 35th International Conference on Advanced Ceramics and Composites, ICACC, Daytona Beach, FL, United States, 11/1/23.

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abstract = "Chemical composition, structure and distribution of secondary phases in two kinds of monolithic SiC ceramics fabricated by liquid phase sintering with SiC nano-powder and 6 or 9 wt.% sintering additives of Al2O3 and Y2O3 were investigated. The major secondary phase in both samples was identified as crystalline yttrium aluminum garnet (YAG) by XRD pattern. EPMA-WDS analysis revealed that the sample containing 9 wt.% additives had the relatively distinct Y-rich and Al-rich regions, by contrast with relatively-homogeneous distribution of the additives elements in the sample containing 6 wt.% additives. The dominating secondary phases at triple junctions of YAG for Y-rich regions and Al2O3 for Al-rich regions in SiC (9 wt.% additives) were identified by TEM-EELS analysis. In SiC (6 wt.% additives), the dominating YAG was observed at triple junctions. High-resolution TEM revealed that amorphous films with content Y, Al and O existed at both the SiC-SiC and SiC-YAG grain boundaries.",

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N2 - Chemical composition, structure and distribution of secondary phases in two kinds of monolithic SiC ceramics fabricated by liquid phase sintering with SiC nano-powder and 6 or 9 wt.% sintering additives of Al2O3 and Y2O3 were investigated. The major secondary phase in both samples was identified as crystalline yttrium aluminum garnet (YAG) by XRD pattern. EPMA-WDS analysis revealed that the sample containing 9 wt.% additives had the relatively distinct Y-rich and Al-rich regions, by contrast with relatively-homogeneous distribution of the additives elements in the sample containing 6 wt.% additives. The dominating secondary phases at triple junctions of YAG for Y-rich regions and Al2O3 for Al-rich regions in SiC (9 wt.% additives) were identified by TEM-EELS analysis. In SiC (6 wt.% additives), the dominating YAG was observed at triple junctions. High-resolution TEM revealed that amorphous films with content Y, Al and O existed at both the SiC-SiC and SiC-YAG grain boundaries.

AB - Chemical composition, structure and distribution of secondary phases in two kinds of monolithic SiC ceramics fabricated by liquid phase sintering with SiC nano-powder and 6 or 9 wt.% sintering additives of Al2O3 and Y2O3 were investigated. The major secondary phase in both samples was identified as crystalline yttrium aluminum garnet (YAG) by XRD pattern. EPMA-WDS analysis revealed that the sample containing 9 wt.% additives had the relatively distinct Y-rich and Al-rich regions, by contrast with relatively-homogeneous distribution of the additives elements in the sample containing 6 wt.% additives. The dominating secondary phases at triple junctions of YAG for Y-rich regions and Al2O3 for Al-rich regions in SiC (9 wt.% additives) were identified by TEM-EELS analysis. In SiC (6 wt.% additives), the dominating YAG was observed at triple junctions. High-resolution TEM revealed that amorphous films with content Y, Al and O existed at both the SiC-SiC and SiC-YAG grain boundaries.

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