Microscopic observation of degradation of LaNiO3 ultrathin films caused by air exposure

Yusuke Wakabayashi, Hiroki Maeda, Tsuyoshi Kimura, Osami Sakata, Enju Sakai, Hiroshi Kumigashira

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Sample degradation of LaNiO3 ultrathin films on SrTiO3 (001) substrate caused by air exposure is examined by means of crystal truncation rod (CTR) scattering method. Although the film is conductive right after the sample deposition, long term storage makes it insulating. CTR measurements were performed on three- and four-unit cell-thick samples just after the sample deposition and after six months of storage in air. The results show that the storage induced a significant increase in the lattice spacing along the surface normal direction with keeping in-plane periodicity. Such a structural change can be caused by escaping oxygen atoms by the thermal uctuation.

Original languageEnglish
Pages (from-to)14-16
Number of pages3
Journale-Journal of Surface Science and Nanotechnology
Volume14
DOIs
Publication statusPublished - 2016 Jan 30
Externally publishedYes

Keywords

  • Heterojunctions
  • Nickel oxides
  • Oxidation
  • X-ray scattering, diffraction, and reflection

ASJC Scopus subject areas

  • Biotechnology
  • Bioengineering
  • Condensed Matter Physics
  • Mechanics of Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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