Microscopic changes of thin films of directly thiolated fullerenes depending on substrate and number of thiol

Hirokazu Fukidome, Masara Sekido, Masamichi Yoshimura, Masanori Tanaka, Masatomi Ohno, Kazuyuki Ueda

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Direct thiolation of fullerene is promising for molecular electronics because it enables high electronic conductivity of fullerene-electrode systems through direct adsorption between thiols and electrodes, for example, via Au-S bonds. Microscopic changes of thin films of directly thiolated fullerene (SH-C60) formed on various substrates, such as bare mica, mica treated in MgCl2 solution, graphite, and gold, have been observed by scanning probe microscopy (SPM). It has been elucidated that the structure of the thin films can be varied from nanodots to self-assembled layers by adjusting three energetic parameters, namely, the type of substrate, surface charge, and the number of -SH groups attached to fullerene. In addition to these energetic parameters, kinetic parameters, for example, supply rate of the molecules to the surfaces, should also be considered in the study of the mechanism underlying the formation of films.

Original languageEnglish
Pages (from-to)5560-5562
Number of pages3
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume46
Issue number8 B
DOIs
Publication statusPublished - 2007 Aug 23
Externally publishedYes

Keywords

  • Atomic force microscopy
  • Fullerene
  • Gold
  • Graphite
  • Kinetics
  • Mica
  • Surface charging
  • Thiolation

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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