TY - GEN
T1 - Micromechanically-coupled resonated system for synchronized oscillation with improved phase noise
AU - Wang, Dong F.
AU - Feng, Jinyang
AU - Ono, Takahito
AU - Esashi, Masayoshi
AU - Ye, Xiongying
PY - 2010
Y1 - 2010
N2 - Frequency enhancement with decreased fluctuation is available by using micromechanically-coupled synchronized resonator system. The system consists of two geometrically designed and empirically fabricated singly-clamped beam-shaped cantilevers (19.5 μm and 30 μm long x 5 μm wide x 100 nm thick). Two cantilevers, with resonant frequencies of 295.72 kHz (detecting) and 145.01 kHz (sensing) respectively, are coupled by a thin support as a mechanical element. The frequency response signal can thus be doubled with a decreased fluctuation when the detecting cantilever is synchronized with the sensing one. A reformed micromechanically-coupled resonator system is further designed using Coventor Ware™ software and vibration modes are simulated for next application study.
AB - Frequency enhancement with decreased fluctuation is available by using micromechanically-coupled synchronized resonator system. The system consists of two geometrically designed and empirically fabricated singly-clamped beam-shaped cantilevers (19.5 μm and 30 μm long x 5 μm wide x 100 nm thick). Two cantilevers, with resonant frequencies of 295.72 kHz (detecting) and 145.01 kHz (sensing) respectively, are coupled by a thin support as a mechanical element. The frequency response signal can thus be doubled with a decreased fluctuation when the detecting cantilever is synchronized with the sensing one. A reformed micromechanically-coupled resonator system is further designed using Coventor Ware™ software and vibration modes are simulated for next application study.
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U2 - 10.1109/MEMSYS.2010.5442309
DO - 10.1109/MEMSYS.2010.5442309
M3 - Conference contribution
AN - SCOPUS:77952771941
SN - 9781424457649
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 703
EP - 706
BT - MEMS 2010 - The 23rd IEEE International Conference on Micro Electro Mechanical Systems, Technical Digest
T2 - 23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010
Y2 - 24 January 2010 through 28 January 2010
ER -