Microfocusing of 82 keV x rays with a sputtered-sliced Fresnel zone plate

M. Awaji, Y. Suzuki, A. Takeuchi, H. Takano, N. Kamijo, M. Yasumoto, Y. Terada, S. Tamura

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

An approach for microfocusing of 82 keV x-rays with a sputtered-sliced Fresnel zone plate (SS-FZP) was described. The SS-FZP consisted of 50 layers of alternative copper layer and aluminum layer deposited on a gold core. The measured distance between the SS-FZP and the focal point was 1.64 m at 82 keV. The achieved beam size was found to be 1.1 μm in vertical and 1.3 μm in horizontal directions while the measured flux density was 7×10 5 (photons/s/μm2).

Original languageEnglish
Pages (from-to)4948-4949
Number of pages2
JournalReview of Scientific Instruments
Volume74
Issue number11
DOIs
Publication statusPublished - 2003 Nov
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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