Microbeam of 100 keV x ray with a sputtered-sliced Fresnel zone plate

Nagao Kamijo, Yoshio Suzuki, Hidekazu Takano, Shigeharu Tamura, Masato Yasumoto, Akihisa Takeuchi, Mitsuhiro Awaji

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

The focusing test of 100 keV x ray with a sputtered-sliced Fresnel zone plate (ss-FZP) was described. Microfocusing was performed using the high brilliant synchrotron radiation from the undulator source with 250-long transport channel. A thick ss-FZP with a thickness of 180 μm was fabricated. Results show that the minimum focal spot size for the first order focal beam was 0.5 μm with a focal distance 900 mm at a photon energy 100 keV.

Original languageEnglish
Pages (from-to)5101-5104
Number of pages4
JournalReview of Scientific Instruments
Volume74
Issue number12
DOIs
Publication statusPublished - 2003 Dec
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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  • Cite this

    Kamijo, N., Suzuki, Y., Takano, H., Tamura, S., Yasumoto, M., Takeuchi, A., & Awaji, M. (2003). Microbeam of 100 keV x ray with a sputtered-sliced Fresnel zone plate. Review of Scientific Instruments, 74(12), 5101-5104. https://doi.org/10.1063/1.1614882