Micro-XANES by EPMA spectrometer

Jun Kawai, Koichi Hayashi, Hideyuki Takahashi, Yoshinori Kitajima

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

XANES (X-ray absorption near edge structure) spectrum of an area of a few tens of square micrometers of MgO is measured with an EPMA (electron probe X-ray microanalyzer) using a novel method - EXEFS (extended X-ray emission fine structure) method - proposed by the present authors. The EXEFS method has the following six remarkable characteristics: (1) high energy resolution, (2) high spatial resolution, (3) short measuring time, (4) easy sample preparation, (5) convenient without using synchrotron radiation facilities, and (6) good at measuring soft X-ray absorption spectra.

Original languageEnglish
Pages (from-to)356-358
Number of pages3
JournalJournal of Synchrotron Radiation
Volume6
Issue number3
DOIs
Publication statusPublished - 1999 May 1

Keywords

  • EPMA
  • EXEFS
  • Electron probe X-ray microanalyzer
  • Radiative Auger effect
  • X-ray emission spectroscopy

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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  • Cite this

    Kawai, J., Hayashi, K., Takahashi, H., & Kitajima, Y. (1999). Micro-XANES by EPMA spectrometer. Journal of Synchrotron Radiation, 6(3), 356-358. https://doi.org/10.1107/S0909049598017270