Methods for obtaining superresolution images in coherent x-ray diffraction microscopy

Yukio Takahashi, Yoshinori Nishino, Tetsuya Ishikawa

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Coherent x-ray diffraction microscopy (CXDM) using an x-ray free electron laser (XFEL) is expected to open up a new frontier of structural studies in materials science and biology, while radiation damage of samples under the extremely intense x rays is a matter of considerable concern. Two superresolution methods for CXDM proposed in this paper offer solutions of the problems by numerical data analysis. Promising results for future applications of CXDM with XFEL were obtained in a numerical simulation.

Original languageEnglish
Article number033822
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume76
Issue number3
DOIs
Publication statusPublished - 2007 Sep 19
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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