TY - JOUR
T1 - Methods for obtaining superresolution images in coherent x-ray diffraction microscopy
AU - Takahashi, Yukio
AU - Nishino, Yoshinori
AU - Ishikawa, Tetsuya
PY - 2007/9/19
Y1 - 2007/9/19
N2 - Coherent x-ray diffraction microscopy (CXDM) using an x-ray free electron laser (XFEL) is expected to open up a new frontier of structural studies in materials science and biology, while radiation damage of samples under the extremely intense x rays is a matter of considerable concern. Two superresolution methods for CXDM proposed in this paper offer solutions of the problems by numerical data analysis. Promising results for future applications of CXDM with XFEL were obtained in a numerical simulation.
AB - Coherent x-ray diffraction microscopy (CXDM) using an x-ray free electron laser (XFEL) is expected to open up a new frontier of structural studies in materials science and biology, while radiation damage of samples under the extremely intense x rays is a matter of considerable concern. Two superresolution methods for CXDM proposed in this paper offer solutions of the problems by numerical data analysis. Promising results for future applications of CXDM with XFEL were obtained in a numerical simulation.
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U2 - 10.1103/PhysRevA.76.033822
DO - 10.1103/PhysRevA.76.033822
M3 - Article
AN - SCOPUS:34548831076
VL - 76
JO - Physical Review A - Atomic, Molecular, and Optical Physics
JF - Physical Review A - Atomic, Molecular, and Optical Physics
SN - 1050-2947
IS - 3
M1 - 033822
ER -