Coherent x-ray diffraction microscopy (CXDM) using an x-ray free electron laser (XFEL) is expected to open up a new frontier of structural studies in materials science and biology, while radiation damage of samples under the extremely intense x rays is a matter of considerable concern. Two superresolution methods for CXDM proposed in this paper offer solutions of the problems by numerical data analysis. Promising results for future applications of CXDM with XFEL were obtained in a numerical simulation.
|Journal||Physical Review A - Atomic, Molecular, and Optical Physics|
|Publication status||Published - 2007 Sep 19|
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics