Method for estimating fault injection time on cryptographic devices from em leakage

Ko Nakamura, Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The existing intentional electromagnetic interference (IEMI) fault injection method based on continuous sinusoidal wave has a difficulty in injecting faults at a specific operation or time. This means that the obtained faulty outputs do not always satisfy a specific condition (e.g., time or number of error bytes) for performing fault analysis such as differential fault analysis (DFA). This paper presents a method for estimating the timing of fault occurrences caused by the above IEMI-based method, which make it possible to examine if an obtained faulty output is available for fault analysis. The idea of this method is to observe side-channel information such as EM leakage and estimate fault injection time from the detection of a characteristic change in the obtained waveform. To validate this method, we performed an IEMI fault injection experiment on actual cryptographic hardware (a side-channel attack standard evaluation board). From the obtained faulty encryption outputs and waveforms, we confirm that the fault injection time estimated by back-calculation of faulty outputs corresponded to that obtained by waveform analysis. We also demonstrate the validity of several non-invasive observation techniques for obtaining waveforms.

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages235-240
Number of pages6
ISBN (Electronic)9781479966158
DOIs
Publication statusPublished - 2015 Sep 10
EventIEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Germany
Duration: 2015 Aug 162015 Aug 22

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2015-Septmber
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

OtherIEEE International Symposium on Electromagnetic Compatibility, EMC 2015
CountryGermany
CityDresden
Period15/8/1615/8/22

Keywords

  • fault analysis
  • intentional electromagnetic interference
  • side-channel information

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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