Mesoscopic scanning tunneling and atomic force microscopy study of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2

Sonia Antoranz Contera; Tatsuo Yoshinobu; Hiroshi Iwasaki; Kenji Kisoda

doi:10.1016/S0039-6028(99)00858-4

Mesoscopic scanning tunneling and atomic force microscopy study of the misfit-layer compounds (LaSe)_xNbSe₂ and (PbSe)_xNbSe₂

Sonia Antoranz Contera, Tatsuo Yoshinobu, Hiroshi Iwasaki, Kenji Kisoda

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The surface of the misfit-layer compounds (LaSe)_xNbSe₂ and (PbSe)_xNbSe₂ is studied by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in air and nitrogen, in the range of 0.5 to 10 μm². The cleaved surface of (LaSe)_xNbSe₂ presents flat non-stepped surfaces which crack and react. Inner layers do not appear to crack. The dynamic process taking place in the superficial layers produces pieces which arrange in a self-similar way and eventually gives rise to discrete islands which self-organize periodically in one direction. On the other hand, the cleaved surface of (PbSe)_xNbSe₂ is stepped and shows no reactivity. The influence of the cleavage, the strain, the strength of the interlayer and intralayer bonding, and the misfit of the compounds are discussed as reasons for the mesoscopic behaviour of these materials.

Original language	English
Pages (from-to)	384-390
Number of pages	7
Journal	Surface Science
Volume	441
Issue number	2-3
DOIs	https://doi.org/10.1016/S0039-6028(99)00858-4
Publication status	Published - 1999 Nov 1
Externally published	Yes

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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@article{837c9a0cb03e4c629fde37e4e6381c90,

title = "Mesoscopic scanning tunneling and atomic force microscopy study of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2",

abstract = "The surface of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2 is studied by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in air and nitrogen, in the range of 0.5 to 10 μm2. The cleaved surface of (LaSe)xNbSe2 presents flat non-stepped surfaces which crack and react. Inner layers do not appear to crack. The dynamic process taking place in the superficial layers produces pieces which arrange in a self-similar way and eventually gives rise to discrete islands which self-organize periodically in one direction. On the other hand, the cleaved surface of (PbSe)xNbSe2 is stepped and shows no reactivity. The influence of the cleavage, the strain, the strength of the interlayer and intralayer bonding, and the misfit of the compounds are discussed as reasons for the mesoscopic behaviour of these materials.",

author = "{Antoranz Contera}, Sonia and Tatsuo Yoshinobu and Hiroshi Iwasaki and Kenji Kisoda",

year = "1999",

month = nov,

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doi = "10.1016/S0039-6028(99)00858-4",

language = "English",

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journal = "Surface Science",

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T1 - Mesoscopic scanning tunneling and atomic force microscopy study of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2

AU - Antoranz Contera, Sonia

AU - Yoshinobu, Tatsuo

AU - Iwasaki, Hiroshi

AU - Kisoda, Kenji

PY - 1999/11/1

Y1 - 1999/11/1

N2 - The surface of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2 is studied by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in air and nitrogen, in the range of 0.5 to 10 μm2. The cleaved surface of (LaSe)xNbSe2 presents flat non-stepped surfaces which crack and react. Inner layers do not appear to crack. The dynamic process taking place in the superficial layers produces pieces which arrange in a self-similar way and eventually gives rise to discrete islands which self-organize periodically in one direction. On the other hand, the cleaved surface of (PbSe)xNbSe2 is stepped and shows no reactivity. The influence of the cleavage, the strain, the strength of the interlayer and intralayer bonding, and the misfit of the compounds are discussed as reasons for the mesoscopic behaviour of these materials.

AB - The surface of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2 is studied by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in air and nitrogen, in the range of 0.5 to 10 μm2. The cleaved surface of (LaSe)xNbSe2 presents flat non-stepped surfaces which crack and react. Inner layers do not appear to crack. The dynamic process taking place in the superficial layers produces pieces which arrange in a self-similar way and eventually gives rise to discrete islands which self-organize periodically in one direction. On the other hand, the cleaved surface of (PbSe)xNbSe2 is stepped and shows no reactivity. The influence of the cleavage, the strain, the strength of the interlayer and intralayer bonding, and the misfit of the compounds are discussed as reasons for the mesoscopic behaviour of these materials.

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