Mechanism of increase in inductance at loosened connector contact boundary

Kazuki Matsuda, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

A loosened connector between interconnected electric devices causes an increase in electromagnetic radiation when the devices operate in high-frequency bands. To develop a high-frequency circuit equivalent to a connector with contact failure, we previously investigated the parasitic elements caused by failure at the contact boundary. From the results of that study, the inductance and resistance at a connection contact boundary are increased by the loosening of a connector. Furthermore, the increase in inductance is the dominant factor in increasing the intensity of the electromagnetic radiation. In this paper, to suppress electromagnetic radiation resulting from a loose contact, we formulate the contact performance requirement needed to maintain a good contact condition when a small loosening has occurred at the interconnection. To this end, we investigate the mechanism of increase in the inductance by loosening the connector.

Original languageEnglish
Pages (from-to)1502-1507
Number of pages6
JournalIEICE Transactions on Electronics
VolumeE95-C
Issue number9
DOIs
Publication statusPublished - 2012 Sep

Keywords

  • Contact failure
  • Inductance
  • Loose contact
  • TDR

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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