Mechanism of apparent reflection of electrons from extra probes investigated by the magnetic electron-focusing effect

S. Takaoka, S. Wakayama, S. G. Inoue, K. Tsukagoshi, K. Oto, K. Murase, K. Gamo

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The magnetic electron-focusing effect (MEFE) has been investigated in mesoscopic multiterminal samples of GaAs/AlxGa1-xAs heterostructures. The MEFE peaks are clearly observed even in a configuration where electrons seem to be reflected from an extra probe between an emitter and a collector probe. To clarify the reflection mechanism, the ''reflection'' peaks are studied in the samples with variously shaped extra probes and in the samples with two extra probes connected by a byway channel or an external circuit. In the reflection events, the electrons different from the electrons injected into the extra probe should be emitted from the extra probe, since the chemical potential of the extra probe becomes higher due to the accumulation of electrons in the extra probe.

Original languageEnglish
Pages (from-to)11661-11665
Number of pages5
JournalPhysical Review B
Volume50
Issue number16
DOIs
Publication statusPublished - 1994 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Mechanism of apparent reflection of electrons from extra probes investigated by the magnetic electron-focusing effect'. Together they form a unique fingerprint.

  • Cite this