TY - JOUR
T1 - Mechanical properties and dislocation dynamics of GaP
AU - Yonenaga, Ichiro
AU - Sumino, Koji
N1 - Funding Information:
The GaP crystal used in the experiment was provided by Mitsubishi Monsanto Chemical Company, to which the authors express their gratitude. This work was supported in part by Special Grant-in-Aid for Education and Research to I. Yonenaga from Tohoku University and also by Scientific Research Grant-in-Aid No. 60302078 from the Ministry of Education, Science and Culture of Japan.
PY - 1989/4
Y1 - 1989/4
N2 - Mechanical properties of GaP crystals are investigated in the temperature range 600–900 °C by means of compression tests. Stress-strain characteristics of a GaP crystal in the temperature range 600–800 °C are very similar to those of a GaAs crystal in the temperature range 450–600 °C. The dynamic state of dislocations during deformation is determined by means of the strain-rate cycling technique. The deformation of GaP is found to be controlled by the dislocation processes the same as those in other kinds of semiconductors such as Si, Ge, and GaAs. The velocity v of dislocations that control deformation is deduced to be v = v0 τ exp(-2.2 eV/kT) as a function of the stress τ and the temperature T, where v0is a constant and k the Boltzmann constant. The Portevin-LeChatelier effect is observed in the stress-strain behavior in the deformation at high temperatures and under low strain rates, which may be attributed to the locking of dislocations by impurities or impurity-defect complexes.
AB - Mechanical properties of GaP crystals are investigated in the temperature range 600–900 °C by means of compression tests. Stress-strain characteristics of a GaP crystal in the temperature range 600–800 °C are very similar to those of a GaAs crystal in the temperature range 450–600 °C. The dynamic state of dislocations during deformation is determined by means of the strain-rate cycling technique. The deformation of GaP is found to be controlled by the dislocation processes the same as those in other kinds of semiconductors such as Si, Ge, and GaAs. The velocity v of dislocations that control deformation is deduced to be v = v0 τ exp(-2.2 eV/kT) as a function of the stress τ and the temperature T, where v0is a constant and k the Boltzmann constant. The Portevin-LeChatelier effect is observed in the stress-strain behavior in the deformation at high temperatures and under low strain rates, which may be attributed to the locking of dislocations by impurities or impurity-defect complexes.
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U2 - 10.1557/JMR.1989.0355
DO - 10.1557/JMR.1989.0355
M3 - Article
AN - SCOPUS:0024622386
SN - 0884-2914
VL - 4
SP - 355
EP - 360
JO - Journal of Materials Research
JF - Journal of Materials Research
IS - 2
ER -