An X-ray excited optical luminescence phenomenon was used for atom resolved X-ray holography. In this study, we measured the incident-beam angular dependence of the X-ray luminescence intensity from a ZnO/MgO/Al 2O3 film. The observed pattern corresponded to the hologram of an Al2O3 substrate, differently from the Zn Kα X-ray fluorescence hologram. This result shows the possibility of the hologram measurement of light elements whose X-ray fluorescence is hardly detectable in air.
- Local structure
- X-ray excited optical luminescence
- X-ray fluorescence holography
- X-ray luminescence
ASJC Scopus subject areas
- Analytical Chemistry