Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

S. Shiraki, H. Ishii, M. Amano, Y. Nihei, M. Owari, C. Oshima, T. Koshikawa, R. Shimizu

    Research output: Contribution to journalArticlepeer-review

    9 Citations (Scopus)

    Abstract

    We have developed an angle-resolving electron energy analyzer with a newly designed input-lens system. In this lens system, angle resolving is accomplished by use of a diffraction-plane aperture. Using this system, both high angular resolution (<0.1°) and high transmission are easily achieved in photoelectron diffraction measurements. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from CaF2(1 1 1) surface. The angular resolution is easily determined by the size of diffraction-plane aperture. By using the diffraction-plane aperture with the angular resolution of ±0.08° or ±0.04°, many fine structures of XPED patterns become to be clearly measured.

    Original languageEnglish
    Pages (from-to)29-35
    Number of pages7
    JournalSurface Science
    Volume493
    Issue number1-3
    DOIs
    Publication statusPublished - 2001 Nov 1

    Keywords

    • Angle resolved photoemission
    • Halides
    • Photoelectron diffraction

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

    Fingerprint Dive into the research topics of 'Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer'. Together they form a unique fingerprint.

    Cite this