Measurements of longitudinal linewidth and relative intensity noise in ultrahigh-speed mode-locked semiconductor lasers

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4 Citations (Scopus)

Abstract

To understand the fluctuations in laser output pulses, information about the longitudinal linewidth forming the pulses and the relative intensity noise (RIN) is very important. In this paper, we conducted detailed measurements of the linewidth and RIN in the oscillating longitudinal mode of a mode-locked laser diode (MLLD) having different fabrication methods for the repetition frequencies of 10 and 40 GHz. The results are a longitudinal linewidth of several megahertz to gigahertz, a constant linewidth exhibiting the longitudinal mode independence, and a larger RIN as the distance from the center of the oscillation spectrum increases.

Original languageEnglish
Pages (from-to)28-36
Number of pages9
JournalElectronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
Volume89
Issue number2
DOIs
Publication statusPublished - 2006 Feb

Keywords

  • Intensity noise
  • Longitudinal linewidth
  • Mode-locked semiconductor laser
  • Short pulse generation

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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