Measurements of auger electron diffraction using a 180° deflection toroidal analyzer

Susumu Shiraki, Hideshi Ishii, Yoshimasa Nihei, Masanori Owari

    Research output: Contribution to journalArticlepeer-review

    8 Citations (Scopus)

    Abstract

    A 180° deflection toroidal analyzer is a novel electron spectrometer, which allows the simultaneous registration of the wide range of polar angles in a given azimuth of the sample. Therefore, measurements of photo- and Auger electron intensities over π steradians can be performed rapidly by azimuthal rotation of the sample. Using this analyzer, two-dimensional patterns of electron-beam-excited O KVV and Mg KVV Auger electron diffraction (AED) from a MgO(001) surface were measured in short acquisition times. The AED patterns obtained were compared with theoretical ones calculated by the multiple-scattering scheme. The agreement between experimental and theoretical data was good for both O KVV and Mg KVV transitions.

    Original languageEnglish
    Pages (from-to)585-590
    Number of pages6
    JournalSurface Review and Letters
    Volume6
    Issue number5
    DOIs
    Publication statusPublished - 1999 Jan 1

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

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