Measurements and Modelling of Noise in DC-Erased Thin-Film Media

Martin J. Vos, Yoichiro Tanaka, Jack H. Judy

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Experimental and theoretical results are given for the noise produced in thin-film media after reverse DC erasure. The noise spectra produced at high bit densities and at reverse DC erasure around the remanent coercivity look identical. A theoretical spectral model based on Poisson statistics shows a good fit with the measured noise spectra. A novel technique for measuring the medium noise in the spatial domain has been developed. The results obtained in the spatial domain through autocorrelation of the read flux agree well with the noise results obtained in the spectral domain.

Original languageEnglish
Pages (from-to)2149-2151
Number of pages3
JournalIEEE Transactions on Magnetics
Volume26
Issue number5
DOIs
Publication statusPublished - 1990 Sep
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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