A novel method of measuring a spatial variation of electrically induced index change (electrooptic effect) in Ti-diffused LiNbO3 optical waveguides is demonstrated. The result of measurements on 45 positions on x-cut and z-cut substrates shows that the spatial variation of the half-wave voltage of the waveguide interferometers is less than ±3%.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering