Measurement of Uniformity of Driving Voltage in Ti:LiNbO3 Waveguides Using Mach-Zehnder Interferometers

Takumi Fujiwara, Akio Watanabe, Hiroshi Mori

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

A novel method of measuring a spatial variation of electrically induced index change (electrooptic effect) in Ti-diffused LiNbO3 optical waveguides is demonstrated. The result of measurements on 45 positions on x-cut and z-cut substrates shows that the spatial variation of the half-wave voltage of the waveguide interferometers is less than ±3%.

Original languageEnglish
Pages (from-to)260-261
Number of pages2
JournalIEEE Photonics Technology Letters
Volume2
Issue number4
DOIs
Publication statusPublished - 1990 Apr
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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