Abstract
A scanning nonlinear dielectric microscope (SNDM) probe, called the ε311-type probe, and a system to measure the ferroelectric polarization component parallel to the surface using rotating electric field have been developed. This is achieved by measuring the ferroelectric material's nonlinear dielectric constant ε311 instead of ε333, which is measured in conventional SNDM. Experimental result shows that we can successfully determine polarization component parallel to the surface. The SNDM system can measure polarization at any angle from the surface normal which is often of interest.
Original language | English |
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Pages (from-to) | 267-272 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 748 |
Publication status | Published - 2003 Jul 28 |
Event | Ferroelectric Thin Films XI - Boston, MA, United States Duration: 2002 Dec 2 → 2002 Dec 5 |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering