Measurement of three dimensional polarization direction in ferroelectric thin films using scanning nonlinear dielectric microscopy with rotating electric field

Hiroyuki Odagawa, Yasuo Cho

Research output: Contribution to journalConference article

Abstract

A scanning nonlinear dielectric microscope (SNDM) probe, called the ε311-type probe, and a system to measure the ferroelectric polarization component parallel to the surface using rotating electric field have been developed. This is achieved by measuring the ferroelectric material's nonlinear dielectric constant ε311 instead of ε333, which is measured in conventional SNDM. Experimental result shows that we can successfully determine polarization component parallel to the surface. The SNDM system can measure polarization at any angle from the surface normal which is often of interest.

Original languageEnglish
Pages (from-to)267-272
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume748
Publication statusPublished - 2003 Jul 28
EventFerroelectric Thin Films XI - Boston, MA, United States
Duration: 2002 Dec 22002 Dec 5

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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