Measurement of the beam profiles with the improved Fresnel Zone Plate monitor

Hiroshi Sakai, Norio Nakamura, Hitoshi Hayano, Toshiya Muto

Research output: Contribution to conferencePaperpeer-review

1 Citation (Scopus)

Abstract

We present the recent progress of the FZP (Fresnel Zone Plate) beam profile monitor constructed at KEK-ATF damping ring. This monitor is based on an X-ray imaging optics with two FZPs [1]. In this monitor, the transverse electron beam image at bending magnet is twenty-times magnified by the two FZPs and detected on an X-ray CCD camera. The expected spatial resolution is less than 1μm in R.M.S. Recently, we install the new mechanical shutter to improve time resolution of the monitor and avoid the effects of the short-term movement of beam or the monitor itself. By applying this shutter, the shutter opening time is reduced less than 1ms and the beam profile could be measured more accurately. In this paper, we report the measurement results of beam profile by the improved FZP beam profile monitor.

Original languageEnglish
Pages2784-2786
Number of pages3
Publication statusPublished - 2006
Event10th European Particle Accelerator Conference, EPAC 2006 - Edinburgh, United Kingdom
Duration: 2006 Jun 262006 Jun 30

Other

Other10th European Particle Accelerator Conference, EPAC 2006
CountryUnited Kingdom
CityEdinburgh
Period06/6/2606/6/30

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

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