Measurement of potential drop distribution by scanning the closely coupled probes sensor for sensitive NDE of shallow surface cracks

Hironori Tohmyoh, Takuma Suzuki, S. Reaz Ahmed, Masumi Saka

Research output: Contribution to journalArticlepeer-review

Abstract

Highly sensitive nondestructive evaluation of shallow surface cracks is realized through the distributions of d-c potential drop obtained by scanning the closely coupled four-point-probes sensor around the crack. A methodology is developed for evaluating the depth and length of a three-dimensional surface crack from the potential drop profiles measured across and along the crack, where the experimental result is compared with the corresponding prediction of finite element analysis. The highly sensitive characteristic of the measured profiles is also extended to the potential drop imaging for identifying the location of cracks in a clear pictorial form. It is verified that the method is a powerful tool for characterizing very small fatigue cracks (sub-millimeter depth) on the surface of metallic structures.

Original languageEnglish
Pages (from-to)1166-1172
Number of pages7
JournalMaterials Transactions
Volume48
Issue number6
DOIs
Publication statusPublished - 2007 Jun

Keywords

  • Closely coupled probes sensor
  • Finite element analysis
  • Nondestructive evaluation
  • Sub-millimeter surface cracks
  • d-c potential drop

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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