Measurement of microscopic stress distribution of multilayered composite by X-ray stress analysis

Tomohiko Adachi, Tohru Sekino, Tadachika Nakayama, Takafumi Kusunose, Koichi Niihara

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)


In order to evaluate the effect of nano-sized dispersoid to microscopic stress distribution of multilayered composite, two kinds of multilayered composites, Al2O3/3 mol% Y2O3-stabilized ZrO2 (3Y-TZP) and Al2O3/3Y-TZP(SiC), were fabricated. The latter composite contained nano-sized SiC dispersion within 3Y-TZP layers. The micro-residual stress measurement by X-ray diffraction (XRD) analysis for the monolithic 3Y-TZP and 3Y-TZP(SiC) nanocomposite layers within each composite revealed the existence of tensile and compressive stresses perpendicular and parallel directions to the layers, respectively. The tensile stress of approximately 200-300 MPa was observed to distribute across the zirconia layers in both composites. On the other hand, much higher compressive stress (i.e., 500-700 MPa) existed with a steep distribution across the layer especially for the monolithic Al2O3/3Y-TZP multilayered composite. However, both tensile and compressive stress distributions were found to be flattened when nano-sized SiC was incorporated into 3Y-TZP layer.

Original languageEnglish
Pages (from-to)3057-3062
Number of pages6
JournalMaterials Letters
Issue number20
Publication statusPublished - 2003 Jun 1


  • Ceramics
  • Multilayer structure
  • Nanocomposite
  • Residual stress
  • Stress distribution
  • X-ray techniques

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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