Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICs

M. Nagata, S. Shimazaki, N. Azuma, S. Takahashi, M. Murakami, K. Hori, Satoshi Tanaka, M. Yamaguchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

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Engineering & Materials Science