Measured stress concentration at a notch front in Si3N4

Shun Ichiro Tanaka

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)

Abstract

Actual concentrated stress distributions at a notch front in Si3N4 were measured by the collimated X-ray sin2Ψ method and validated by the fracture mechanics. The elliptic model well expresses the features of stress distribution at a U and V notch front with finite length and root radius. The stress intensity factor, KI, can be obtained experimentally from the measured distribution with the characteristic function of the elliptic model which can successfully predict the concentrated stress distribution and σ0. An apparent stress singularity was observed to be 0.5 in the range 0.05-0.5 mm from the tip, but the elliptic model also provide a similar linear tendency. On the other hand, a pop-in crack introduced large residual stress and caused non-linearity and higher stress concentration, which suggests the underestimation of the fracture toughness value, KIC.

Original languageEnglish
Pages (from-to)586-591
Number of pages6
JournalMaterials Science Forum
Volume347
Publication statusPublished - 2000 Jan 1
Externally publishedYes
EventProceedings of the 5th European Conference on Residual Stresses - Delft-Noordwijkerhout, Neth
Duration: 1999 Sep 281999 Sep 30

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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