Material analysis end-station of the Hyogo-ken beamline at SPring-8

T. Kaneyoshi, T. Ishihara, H. Yoshioka, M. Motoyama, S. Fukushima, K. Hayashi, J. Kawai, K. Taniguchi, S. Hayakawa, Y. Gohshi

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.

Original languageEnglish
Pages (from-to)509-511
Number of pages3
JournalJournal of Synchrotron Radiation
Issue number3
Publication statusPublished - 1998 May 1
Externally publishedYes


  • Polarized X-ray emission spectroscopy
  • SPring-8
  • Surface analysis
  • X-ray diffraction
  • X-ray fluorescence analysis
  • X-ray fluorescence holography

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation


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