Material analysis end-station of the Hyogo-ken beamline at SPring-8

T. Kaneyoshi; T. Ishihara; H. Yoshioka; M. Motoyama; S. Fukushima; K. Hayashi; J. Kawai; K. Taniguchi; S. Hayakawa; Y. Gohshi

doi:10.1107/S0909049598001502

Material analysis end-station of the Hyogo-ken beamline at SPring-8

T. Kaneyoshi, T. Ishihara, H. Yoshioka, M. Motoyama, S. Fukushima, K. Hayashi, J. Kawai, K. Taniguchi, S. Hayakawa, Y. Gohshi

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.

Original language	English
Pages (from-to)	509-511
Number of pages	3
Journal	Journal of Synchrotron Radiation
Volume	5
Issue number	3
DOIs	https://doi.org/10.1107/S0909049598001502
Publication status	Published - 1998 May 1
Externally published	Yes

Keywords

Polarized X-ray emission spectroscopy
SPring-8
Surface analysis
X-ray diffraction
X-ray fluorescence analysis
X-ray fluorescence holography

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Instrumentation

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title = "Material analysis end-station of the Hyogo-ken beamline at SPring-8",

abstract = "Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.",

keywords = "Polarized X-ray emission spectroscopy, SPring-8, Surface analysis, X-ray diffraction, X-ray fluorescence analysis, X-ray fluorescence holography",

author = "T. Kaneyoshi and T. Ishihara and H. Yoshioka and M. Motoyama and S. Fukushima and K. Hayashi and J. Kawai and K. Taniguchi and S. Hayakawa and Y. Gohshi",

year = "1998",

month = may,

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doi = "10.1107/S0909049598001502",

language = "English",

volume = "5",

pages = "509--511",

journal = "Journal of Synchrotron Radiation",

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T1 - Material analysis end-station of the Hyogo-ken beamline at SPring-8

AU - Kaneyoshi, T.

AU - Ishihara, T.

AU - Yoshioka, H.

AU - Motoyama, M.

AU - Fukushima, S.

AU - Hayashi, K.

AU - Kawai, J.

AU - Taniguchi, K.

AU - Hayakawa, S.

AU - Gohshi, Y.

PY - 1998/5/1

Y1 - 1998/5/1

N2 - Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.

AB - Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.

KW - Polarized X-ray emission spectroscopy

KW - SPring-8

KW - Surface analysis

KW - X-ray diffraction

KW - X-ray fluorescence analysis

KW - X-ray fluorescence holography

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