Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope

Kimitake Yamamoto, Norio Watanabe, Akihisa Takeuchi, Hidekazu Takano, Tatsuya Aota, Masanori Fukuda, Sadao Aoki

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

An X-ray fluorescence imaging microscope with a Wolter-type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring-8. Monochromatic X-rays (ΔE/E ≃ 10-4) in the energy range 6-10 keV were used for X-ray fluorescence excitation of the specimens. Using two monochromatic X-rays above and below the absorption edge of a particular element, a two-dimensional image of the element could be obtained. As a result, two-dimensional element mapping of the test specimens (Cu, Co, Ni, Fe and Ti wires) and constituent minerals (Fe, Mn and Ti) of a rock specimen (a piemontite-quartz schist) became possible.

Original languageEnglish
Pages (from-to)34-39
Number of pages6
JournalJournal of Synchrotron Radiation
Volume7
Issue number1
DOIs
Publication statusPublished - 2000 Jan 1
Externally publishedYes

Keywords

  • Imaging
  • Microscopes
  • Wolter-type mirrors
  • X-ray fluorescence

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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