Inelastic-electron-tunneling (IET) spectroscopy has been applied, to investigate the magnon-induced inelastic tunneling process for Ta/N 80Fe20/Cu/Ni80Fe20/IrMn/Co 75Fe25/Al-oxide/Co75Fe25/Ni 80Fe20/Ta ferromagnetic tunnel junctions. For the junction with the oxidation time, t0x = 40 s, which is the exact time to oxidize the 8 A Al, the subtraction spectrum of the IET spectra between the parallel and anti-parallel magnetization configurations clearly showed two peaks at + 3 and + 16 mV showed, On the other hand, the spectrum for the junction with tox = 120 s showed a broad, peak at around 1.8.mV and a plateau at zero-bias. This was caused by the change of the correlation, length of magnon inelastic excitation due to the over oxidation of the bottom electrode.
- Interface structure
- Transport properties
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics