Magnetostriction measurements of L10Fe50Pt(50-x)Pdx thin films

W. Li, W. Zhou, P. Lenox, T. Seki, K. Takanashi, A. Jander, P. Dhagat

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

L10 ordered FePtPd alloy films, with strong perpendicular magnetic anisotropy, are leading candidates for recording media in next-generation hard disk drives and solid state magnetic random access memory (MRAM) technologies. The magnetostrictive properties of such materials are of importance, as strain thereby in these systems will impact their magnetic switching characteristics. In heat assisted magnetic recording, for example, the medium experiences large strains due to thermal expansion during recording, while MRAM bit cells are often subject to large process-induced strains. Further, the discovery or design of a highly magnetostrictive, high-anisotropy material would be advantageous to the development of strain-assisted magnetic recording [1] or MRAM based on synthetic multiferroics [2].

Original languageEnglish
Title of host publication2015 IEEE International Magnetics Conference, INTERMAG 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479973224
DOIs
Publication statusPublished - 2015 Jul 14
Event2015 IEEE International Magnetics Conference, INTERMAG 2015 - Beijing, China
Duration: 2015 May 112015 May 15

Publication series

Name2015 IEEE International Magnetics Conference, INTERMAG 2015

Other

Other2015 IEEE International Magnetics Conference, INTERMAG 2015
CountryChina
CityBeijing
Period15/5/1115/5/15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

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    Li, W., Zhou, W., Lenox, P., Seki, T., Takanashi, K., Jander, A., & Dhagat, P. (2015). Magnetostriction measurements of L10Fe50Pt(50-x)Pdx thin films. In 2015 IEEE International Magnetics Conference, INTERMAG 2015 [7157265] (2015 IEEE International Magnetics Conference, INTERMAG 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2015.7157265