Magnetoresistance properties of cu/co/cu/nife multilayers with a few stacking numbers

Daisuke Mlyauchi, Satoru Araki

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

[Cu/Co/Cu/NiFe]N multilayers were prepared using electron-beam evaporation in an ultrahigh vacuum and their magnetoresistive (MR) properties with a few stacking numbers (N) were studied. The N dependence of the MR property was affected by the magnetic layer thickness. In the range of NS2, a thick magnetic layer was required to obtain a large MR ratio. In the multilayer of Cr(50 Å)/NiFe(50 Å)/Cu(50 Å)/Co(50 Å)/Cu(50 Å)/NiFe(50 Å) N=1.5), the MR ratio of 5.6% and the MR slope of 0.5%/Oe were obtained.

Original languageEnglish
Pages (from-to)L31-L34
JournalJapanese journal of applied physics
Volume34
Issue number1
DOIs
Publication statusPublished - 1995 Jan
Externally publishedYes

Keywords

  • Cu/Co/Cu/NiFe multilayers
  • Induced ferrimagnetic structure
  • Magnetoresistance
  • Stacking numbers
  • Transport properties

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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