Abstract
[Cu/Co/Cu/NiFe]N multilayers were prepared using electron-beam evaporation in an ultrahigh vacuum and their magnetoresistive (MR) properties with a few stacking numbers (N) were studied. The N dependence of the MR property was affected by the magnetic layer thickness. In the range of NS2, a thick magnetic layer was required to obtain a large MR ratio. In the multilayer of Cr(50 Å)/NiFe(50 Å)/Cu(50 Å)/Co(50 Å)/Cu(50 Å)/NiFe(50 Å) N=1.5), the MR ratio of 5.6% and the MR slope of 0.5%/Oe were obtained.
| Original language | English |
|---|---|
| Pages (from-to) | L31-L34 |
| Journal | Japanese journal of applied physics |
| Volume | 34 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1995 Jan |
| Externally published | Yes |
Keywords
- Cu/Co/Cu/NiFe multilayers
- Induced ferrimagnetic structure
- Magnetoresistance
- Stacking numbers
- Transport properties
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)