Magnetoresistance and planar Hall effects in submicron exchange-coupled NiO/Fe19Ni81 wires

A. Nemoto, Y. Otani, S. G. Kim, K. Fukamichi, O. Kitakami, Y. Shimada

Research output: Contribution to journalArticlepeer-review

40 Citations (Scopus)

Abstract

The magnetization process of the submicron scale exchange-coupled area was successfully examined by magnetotransport measurements. The magnetization reversal was found to take place through coherent rotation in the cross, suggesting the presence of an antiferromagnetic single domain. The magnitude of the exchange coupling field varied inversely proportional to the wire width.

Original languageEnglish
Pages (from-to)4026-4028
Number of pages3
JournalApplied Physics Letters
Volume74
Issue number26
DOIs
Publication statusPublished - 1999 Jun 28

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Magnetoresistance and planar Hall effects in submicron exchange-coupled NiO/Fe<sub>19</sub>Ni<sub>81</sub> wires'. Together they form a unique fingerprint.

Cite this